MPI CANTELIVER PROBE CARDS

MPi Canteliver Probe Cards

MPi Canteliver Probe Cards

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Canteliver Probe Card

MPI Cantilever Probe Card is widely utilized on gold bump and pad wafer screening for display driver, logic, and memory product. MPI’s cantilever probes would be the corresponding remedy into the calls for of fi­ne pitch, small pad dimensions, significant velocity, less cleansing, multi-DUT, substantial pin depend, and ultra-low leakage requirements. With fantastic craftsmanship, ground breaking architecture and established methodologies based upon mechanical and electrical simulation/measurement results, earning MPI the very best cantilever supplier all over the world.


FCB Probe Card

The FCB Probe Card is the most experienced technology of buckling beam probe card. It's aimed to attain the semiconductor ship manufacture time-to-marketplace (TTM) and cost of exam (COT) demand from customers. FCB is often a demonstrated Option for a range of semiconductor generation assessments from early engineering pilot-runs to higher quantity producing (HVM). FCB is prepared for unit requiring superior sign integrity probing (SI) and/or electricity integrity probing (PI). Programs include chopping-edge SiPs/SoCs, WLP, graphic processors, micro processor, industrial microcontrollers, plus much more. FCB guarantees the world’s most effective Over-all Expense-of-ownership (COO) for various DUT apps.


EVS Probe Card

The EVS Probe Card is surely an improvement in excess of the conventional buckling beam probe card. Vital characteristics are greater current carrying ability (C.C.C.) and lower well balanced Get in touch with pressure (BCF), in addition to In general MEMS-like qualities. EVS can certainly satisfy the need of Sophisticated wafer probing. Specific alignment and superb planarity Command will be the vital aspects contributing to secure Get in touch with resistance. With its ability and performance, EVS Probe Card is an excellent option for advanced probe cards.


Osprey probe Parametric Probe Cards card

The Osprey probe card is MPI’s Option to demand for ever finer pitch. It can be suitable for smaller sized Al pad, and is also perfect for very small pitch application with peripheral and complete array pattern. With exact alignment and superior planarity control, Osprey can attain increased productiveness by multi-DUT structure.  The forming wire (FW) kind needle made with MPI’s possess micro fabrication course of action don't just provides high-high quality efficiency but in addition lets quick needle substitution and shortens maintaining cycle time.



Kestrel Probe Card

The Kestrel Probe Card is equipped with MEMS wire (MW) needle which is designed for the demand of low force probing. It also comes along with a chance to fulfill significant C.C.C. and substantial pin counts software. The MEMS method guarantees extremely constant needle traits, and also the special structure design permits exact alignment and planarity Management.


MPI probe card division provides a wide range of solutions to the semiconductor wafer level test market. Integrated Circuit (IC) applications include Drivers, Logic, CIS, RF, Flip Chip and Cu Pillars. MPI’s comprehensive designs, robust manufacturing and state-of-the-art tooling, enables MPI to provide unsurpassed solutions globally for your challenges both today and for many generations to come.

https://www.mpi-corporation.com/probecard/

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